*1 Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is <800 fsRMS (typical).
For developing today’s high-speed serial devices, the DSA8200 Digital Serial Analyzer sampling oscilloscope is the most versatile tool for communication, computer and consumer electronics gigabit transmitter and signal path characterization, and compliance verification. With exceptional bandwidth, signal fidelity, and the most extensible modular architecture, the DSA8200 provides the highest performance TDR and interconnect analysis, most accurate analysis of signal impairments, and BER calculations for current and emerging serial data technology.
The DSA8200 provides unmatched measurement system fidelity with ultra-low jitter floor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benefits from the 200 fs acquisition jitter with the Phase Reference module. And in another step forward for a sampling oscilloscope, with the help of the Phase Reference module the DSA8200 can acquire and measure SSC (Spread Spectrum Clocking) signals.
The multiprocessor architecture, with dedicated per-slot digital signal processors (DSPs), provides fast waveform acquisition rates, reducing the test times necessary for reliable characterization and compliance verification.
The DSA8200’s versatile modular architecture supports a large and growing family of plug-ins enabling you to configure your measurement system with a wide variety of electrical, optical, and accessory modules that best suit your application now and in the future. With 6 module slots, the DSA8200 can simultaneously accommodate a Clock Recovery module, a precision Phase Reference module, and multiple acquisition modules, electrical or optical, so you can match system performance to your evolving needs.
Featuring industry-leading signal fidelity, the family of electrical modules includes bandwidth performance from 12 GHz to 70+ GHz. Two true-differential Time Domain Reflectometer (TDR) modules, with remote samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time and 12 ps incident rise time. The family of low-noise variable-bandwidth electrical modules provides the industry's best noise performance with remote samplers, featuring 450 μVRMS noise at 60 GHz, and 300 μVRMS at 30 GHz.
DSA8200 optical modules provide complete optical test solutions with superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules cover a range of wavelengths for both single- and multi-mode fibres. Each module can be optionally configured with a number of selectable optical reference receiver (ORR) filters and/or a full bandwidth path. The 80C07B, 80C08C, and 80C11 can be configured with a number of available flexible integrated clock recovery options. The 80C12 and 80C14 Multirate module clock recovery support is achieved with an electrical output for use with the 80A05 module, or CR175A/CR125A instruments.
The DSA8200’s popular FrameScan? acquisition mode can be used with patterns from DUTs, BERTs, and other sources, to isolate pattern-dependent effects in transmitters or show the bit sequence preceding a mask violation. FrameScan automatically sequences the time base so that each bit of the data stream is acquired in time order. When used in combination with mask-testing conditional acquisition features of the DSA8200, such as stop after mask hits, FrameScan can automatically identify at which bit a pattern-dependent failure occurred.
In addition, specialized modules supporting features such as single-ended and differential electrical clock recovery, electrostatic protection for the TDR, and connectivity to the popular TekConnect probing system brings you the performance of Tektronix state-of-the-art probes for high-impedance and differential probing. Low-impedance probes for 50 ? probing and for TDR probing are also available.
High-speed serial data link measurements and analysis are supported with three software solutions: 80SJARB, 80SJNB Essentials, and 80SJNB Advanced.
80SJARB is a basic jitter measurement tool capable of measuring jitter on any waveform – random or repetitive. The simplicity of acquisition limits the amount of analysis possible so only the simplest decomposition can be used; repeatability is pattern dependent.
80SJNB Essentials offers complete analysis of jitter, noise, and BER, with decomposition of components for clear understanding of a signal’s problems and margins. The acquisition methodology requires a repetitive pattern. Both accuracy and repeatability are improved relative to 80SJARB since the tool has access to the complete signal pattern.
80SJNB Advanced adds features to 80SJNB Essentials for Serial Data Link Analysis – de-embedding of fixture, channel emulation, FFE/DFE equalization, pre-emphasis/de-emphasis.
The DSA8200 is the industry’s highest performance fully integrated Time Domain Reflectometry (TDR) measurement system. Offering true-differential TDR measurements up to 50 GHz bandwidth with 15 ps reflected rise time and 12 ps incident rise time, you are able to keep pace with today’s most demanding Serial Data Network Analysis (SDNA) requirements.
The 80E10 and 80E08 TDR modules feature a fully integrated independent dual-channel 2-meter remote sampler system to minimize fixturing and assure optimal system fidelity. Independent sampler deskew ensures fast and easy fixture and probe de-embedding. The user can characterize differential crosstalk by using TDR steps from a differential module to drive one line pair while monitoring a second line pair with a second differential module.
The DSA8200 is the industry’s most versatile TDR measurement system, accommodating up to 4 dual-channel true-differential TDR modules for fast, accurate multilane impedance and S-parameter characterization.
The P80318 True-differential TDR probe and P8018 Single-ended Passive Handheld TDR probe provide high-performance probing solutions for circuit board impedance and electrical signal characterization. The P80318, an 18 GHz 100 ? ?input impedance differential TDR hand probe, enables high-fidelity impedance measurements of differential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR probe. Both the P80318 and P8018 can be used as stand-alone probes but are especially designed to work with the 80A02 for the control of EOS/ESD protection.
As clock speeds and rise times of digital circuits increase, interconnect signal integrity dramatically affects digital system performance. Accurate and efficient Serial Data Network Analysis (SDNA) of the signal path and interconnects in time and frequency domains is critical to predict signal losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye diagram degradation, ensuring reliable system operation.
Tektronix offers several true-differential TDR modules, which in combination with IConnect® software, allow S-parameters measurements with up to –70 dB of dynamic range. This performance assures accurate repeatable measurement in serial data analysis, digital design, signal integrity, and electrical compliance testing applications.
The table below summarizes the S-parameter measurement bandwidth performance when IConnect and the true-differential TDR modules are used in combination.
|
TDR Module |
S-parameter Measurement Bandwidth Performance |
|---|---|
|
80E10 |
50 GHz |
|
80E08 |
30 GHz |
|
80E04 |
20 GHz |
With the long record length acquisitions, IConnect® provides great flexibility for obtaining the desired frequency range and frequency step when performing S-parameter measurements. Up to 1,000,000 points can be acquired*2.
When you employ IConnect® Signal Integrity TDR and S-parameter software with the DSA8200 you have an efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of multi-gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter, and eye-diagram tests, and fault isolation. IConnect can help you complete interconnect analysis tasks in minutes instead of days, resulting in faster system design time and lower design costs. IConnect also enables impedance, S-parameters, and eye-diagram compliance testing as required by many serial data standards, as well as full channel analysis, Touchstone (SnP) file output, and SPICE modeling for gigabit interconnects.
*2 Long record lengths are supported only on DSA8200, CSA8200, TDS8200, CSA8000, and TDS8000 platforms.
The 80E10, with its 12 ps typical TDR rise time, provides superior resolution enabling the fastest and most efficient fault isolation in package, circuit board, and on-chip failure analysis applications.
Specifically designed for ultra high-performance optical and electrical serial data applications, the DSA8200 is the ideal tool for design characterization and validation, as well as manufacturing test of datacom and telecom components, transceiver subassemblies, and transmission systems. The DSA8200 generates measurement results, not just raw data, with time and amplitude histograms, mask testing, and statistical measurements. It provides a communications-tailored measurement set that includes jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude. In addition, you can do mask testing of SONET/SDH, 100 Gigabit (4×25), 10 Gigabit, Gigabit Ethernet, and other electrical and optical standards compliance verification. Color grading and intensity grading of waveform data adds a third dimension, sample density, to your signal acquisitions and analysis to provide visual insight. In addition, the variable persistence database feature enables exact data aging to all of the functions, and facilitates eye measurements on DUTs under adjustment.
The DSA8200 provides an open Windows environment offering new levels of data analysis on the instrument using your favorite commercially available third-party software packages. Additionally, TekVISA?, a standard software accessory, allows the instrument to be placed under the control of software applications (such as LabVIEW, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument or on an external PC workstation's network connected to the instrument without the need of a GPIB hardware interface. Plug-and-play drivers for LabVIEW and other programs are also supplied.
The DSA8200 combines the familiarity of Microsoft's Windows XP operating system with world-class waveform acquisition technology. This platform provides a wide array of standard instrumentation and communications interfaces, including: GPIB, parallel printer port, RS-232-C, USB serial ports, and an Ethernet LAN connection. In addition, the platform includes a DVD-CD/RW combo drive and removable hard drive for storage of waveforms, setups, and analysis results.
Tektronix optical modules for DSA8200 offer highest level of integration in the industry, with corresponding higher repeatability and transferability of the result. A particularly method-sensitive measurement, Extinction Ratio (ER) is now also available as ER Calibrated, with an additional layer of improvement to the portability of the result (80C08C, 80C11, and 80C14 modules only).
The new 80C14 is a broad-wavelength (700 to 1650 nm) multirate optical sampling module that supports 10 Gb/s applications including both datacom and telecom. The supported datacom applications include 10GbE at 9.95, 10.31, 11.09 Gb/s and 8G Fibre Channel, 10G Fibre Channel, 16G Fibre Channel applications at 8.5, 10.51, 11.3, 14.025 Gb/s. The 80C14 also provides telecom rate testing at 9.95, 10.66, 10.70, and 12.5 Gb/s. 14G Infiniband FDR is also supported at 14.063 Gb/s.
With its amplified O/E design, the 80C14 provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power optical signals. Clock recovery for the 80C14 is provided by the CR175A or CR286A Clock Recovery Instrument (sold separately).
The 80C08C is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing datacom rate testing for 10GbE applications at 9.95, 10.31, 11.09 Gb/s and 10G Fibre Channel applications at 10.51 Gb/s. The 80C08C also provides telecom rate testing with several filters between 9.95 and 11.3 Gb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low power level optical signals. The 80C08C can be optionally configured with integrated clock recovery options that can support any standard or user-defined rate in a continuous range from 9.8 to 12.6 Gb/s.
The 80C012 is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing 1G, 2G, and 4G telecom and datacom testing. This highly flexible module can be configured to support either lower data rate applications (1 to 4 Gb/s) or a wide variety of 10 Gb/s applications. The low data rate applications include: 1, 2, and 4 Fibre Channel and “by 4” wavelength division multiplex standards such as 10GBase-X4 and 4-Lane 10 Gb/s Fibre Channel. The supported 10 Gb/s applications include both datacom and telecom. The supported 10 Gb/s datacom applications include 10GbE at 9.95, 10.31, 11.09 Gb/s, 8G Fibre Channel, and 10G Fibre Channel applications at 8.5 Gb/s, 10.51, and 11.3 Gb/s. The 80C12 also provides telecom rate testing at 9.95, 10.66, and 10.70 Gb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low power level optical signals. Clock recovery for the 80C12 is provided through the 80A05 module or CR125A instrument (sold separately).
The 80C11 is optimized for testing of long wavelength signals (1100 to 1650 nm) at a number of rates around 10 Gb/s with a highly flexible multirate filter. Additionally the high optical bandwidth of 30 GHz (typical) and the excellent frequency response of its full bandwidth path is well suited for general purpose high-performance optical component testing. The 80C11 can be configured with clock recovery options that supports any standard or user-defined rate from 9.8 to 12.6 Gb/s.
The 80C07B is a broad-wavelength (700 to 1650 nm) multirate optical sampling module optimized for testing datacom/telecom signals from 155 to 2500 Mb/s. With its amplified O/E design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be optionally configured with multirate clock recovery that operates from 155 to 2.7 Mb/s.
The 80C10B module provides integrated and selectable reference receiver filtering, enabling compliance testing at either 1310 nm or 1550 nm for 39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1), 41.25 Gb/s (40GBase-FR), and 43.018 Gb/s [G.709 FEC, OTU3, (4x10G LAN PHY)] rates. In addition to the filter rates, the user may also choose selectable bandwidths of 30 GHz, 65 GHz, and 80 GHz for 80C10B for optimal noise vs. bandwidth performance for accurate signal characterization. The 80C10B is optionally available with Option F1 which extends filter selections to include 27.739 Gb/s (100GBase-LR4 + FEC and 100GBase-ER4 + FEC), and 25.781 Gb/s (100GBase-LR4 and 100GBase-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as the Tektronix CR286A-HS). The 80C10B is also optionally available in a bundled ordering configuration which includes a 70+ GHz electrical sampling channel.
80C25GBE module provides 65 GHz full bandwidth with integrated selectable reference receiver filtering, enabling compliance testing at either 1310 nm or 1550 nm for 27.739G (100GBase-LR4 + FEC and 100GBase-ER4 + FEC), and 25.781G (100GBase-LR4 and 100GBase-ER4). When equipped with Option CRTP, an electrical signal pickoff is provided for clock recovery using an external module (such as the Tektronix CR286A-HS).
Depend on Tektronix to provide you with performance you can count on. In addition to industry-leading service and support, this product comes backed by a one-year warranty as standard.
Optical Modules: 80C07B
|
Module |
80C07B |
||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
|
Opt. |
F1 |
F2 |
F3 |
F4 |
F5 |
F6 |
F7 |
F8 |
F9 |
F10 |
CR1 |
|
Bandwidth (GHz) |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
2.5 |
|
Wavelength Range (nm) |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
|
Fibre Input (μm) |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
|
Mask Test Sensitivity (dBm) |
–22 |
–22 |
–22 |
–22 |
–22 |
–22 |
–22 |
–22 |
–22 |
–22 |
–22 |
|
Number of Channels |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
|
Rates Supported: ?=Filter, ?=Optical Clock Recovery, ⊕=Electrical Clock Recovery |
|||||||||||
|
125 Mb/s*3 |
? |
? |
? |
? |
|
|
|
|
|
|
? |
|
155 Mb/s |
? |
? |
? |
? |
|
|
|
|
|
|
? |
|
622 Mb/s |
? |
|
|
|
? |
? |
? |
|
|
|
? |
|
1063 Mb/s |
|
? |
|
|
? |
|
|
? |
? |
|
? |
|
1250 Mb/s |
|
|
? |
|
|
? |
|
? |
|
? |
? |
|
2125 Mb/s |
|
|
|
? |
|
|
? |
|
? |
? |
? |
|
2488 Mb/s |
? |
? |
? |
? |
? |
? |
? |
? |
? |
? |
? |
|
2500 Mb/s |
? |
? |
? |
? |
? |
? |
? |
? |
? |
? |
? |
|
3.125 Gb/s |
|
|
|
|
|
|
|
|
|
|
|
|
3.188 Gb/s |
|
|
|
|
|
|
|
|
|
|
|
|
3.32 Gb/s |
|
|
|
|
|
|
|
|
|
|
|
|
4.25 Gb/s |
|
|
|
|
|
|
|
|
|
|
|
|
9.95 Gb/s |
|
|
|
|
|
|
|
|
|
|
|
*3 125 Mb/s is supported by selecting 155 Mb/s rate.
Optical Modules: 80C08C, 80C10B, 80C11, and 80C25GBE
|
Module |
80C08C |
80C10B*5 |
80C11 |
80C25GBE |
||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Opt. |
|
CR1 |
CR2 |
CR4 |
|
CRTP |
F1 |
|
CR1 |
CR2 |
CR3 |
CR4 |
|
CRTP |
|
Bandwidth (GHz) |
10 |
10 |
10 |
10 |
80 |
|
65 |
30 |
30 |
30 |
30 |
30 |
65 |
|
|
Wavelength Range (nm) |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
1290-1330 1520-1620 |
|
1290-1330 1520-1620 |
1100-1650 |
1100-1650 |
1100-1650 |
1100-1650 |
1100-1650 |
1290-1330 1520-1620 |
|
|
Fibre Input (μm) |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 |
|
9 |
9 |
9 |
9 |
9 |
9 |
9 |
|
|
Mask Test Sensitivity (dBm) |
–16 |
–15 |
–15 |
–15 |
–7 |
|
–8 |
–9 |
–9 |
–9 |
–9 |
–9 |
–8 |
|
|
Number of Channels |
1 |
1 |
1 |
1 |
1 |
|
1 |
1 |
1 |
1 |
1 |
1 |
1 |
|
|
Rates Supported: ?=Filter, ?=Optical Clock Recovery, ⊕=Electrical Clock Recovery |
|
|
||||||||||||
|
9.95 Gb/s |
? |
? |
|
? |
|
|
|
?? |
? |
? |
? |
? |
|
|
|
10.31 Gb/s |
? |
? |
? |
? |
|
|
|
? |
|
|
|
? |
|
|
|
10.52 Gb/s |
? |
|
? |
? |
|
|
|
? |
|
|
|
? |
|
|
|
10.66 Gb/s |
? |
|
|
? |
|
|
|
? |
? |
|
|
? |
|
|
|
10.71 Gb/s |
? |
|
|
? |
|
|
|
? |
|
? |
? |
? |
|
|
|
11.1 Gb/s |
? |
|
|
? |
|
|
|
? |
|
|
|
? |
|
|
|
11.3 Gb/s |
? |
|
|
? |
|
|
|
? |
|
|
|
? |
|
|
|
25.78 Gb/s |
|
|
|
|
|
?*6 |
? |
|
|
|
|
|
? |
?*6 |
|
27.74 Gb/s |
|
|
|
|
|
?*6 |
? |
|
|
|
|
|
? |
?*6 |
|
39.81 Gb/s |
|
|
|
|
? |
?*4 |
? |
|
|
|
|
|
|
?*4 |
|
41.25 Gb/s |
|
|
|
|
? |
?*4 |
? |
|
|
|
|
|
|
?*4 |
|
43.02 Gb/s |
|
|
|
|
? |
?*4 |
? |
|
|
|
|
|
|
?*4 |
*4 Contact Tektronix for details.
*5 Option CRTP reduces sensitivity by 0.6 dB (max) and increases noise by 15% (max).
*6 Clock recovery with CR286A-HS (sold separately).
{C}Optical Modules: 80C12 and 80C14
|
Module |
80C12 |
80C14 |
|||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
|
Opt. |
F1 |
F2 |
F3 |
F4 |
F5 |
F6 |
FC |
10G |
CR*7, 8 |
|
CR*8 |
|
Bandwidth (GHz) |
4.25 |
9 |
9 |
4.25 |
9 |
9 |
9 |
10 |
|
14 |
|
|
Wavelength Range (nm) |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
700-1650 |
|
700-1650 |
|
|
Fibre Input (μm) |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
9 or 50 or 62.5 |
|
9 or 50 or 62.5 |
|
|
Mask Test Sensitivity (dBm) |
–19 |
–19 |
–19 |
–19 |
–19 |
–19 |
–19 |
–14 |
|
–15 |
|
|
Number of Channels |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
|
|
|
|
Rates Supported: ?=Filter, ?=Optical Clock Recovery, ⊕=Electrical Clock Recovery |
|||||||||||
|
155 Mb/s |
|
|
|
|
|
|
|
|
?*7 |
|
|
|
622 Mb/s |
|
|
|
|
|
|
|
|
?*7 |
|
|
|
1063 Mb/s |
? |
|
? |
|
|
|
|
|
?*7 |
|
|
|
1250 Mb/s |
|
|
|
|
|
|
|
|
?*7 |
|
|
|
2125 Mb/s |
? |
? |
? |
? |
|
? |
|
|
?*7 |
|
|
|
2488 Mb/s |
|
|
|
|
|
|
|
|
?*7 |
|
|
|
2500 Mb/s |
|
|
|
|
|
|
|
|
?*7 |
|
|
|
3.125 Gb/s |
|
|
|
? |
? |
? |
? |
|
?*7 |
|
|
|
3.188 Gb/s |
|
|
|
? |
? |
? |
? |
|
?*7 |
|
|
|
3.32 Gb/s |
|
|
|
|
|
|
? |
|
?*7 |
|
|
|
4.25 Gb/s |
? |
? |
|
? |
? |
|
|
|
?*7 |
|
|
|
8.5 Gb/s*9 |
|
? |
? |
|
? |
? |
? |
? |
?*10 |
? |
?*10 |
|
9.95 Gb/s |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
10.31 Gb/s*9 |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
10.52 Gb/s |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
10.66 Gb/s |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
10.71 Gb/s |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
11.1 Gb/s |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
11.3 Gb/s |
|
|
|
|
|
|
|
? |
?*8 |
? |
?*8 |
|
12.5 Gb/s |
|
|
|
|
|
|
|
|
|
? |
?*8 |
|
14.025 Gb/s |
|
|
|
|
|
|
|
|
|
? |
CR175A |
|
14.063 Gb/s |
|
|
|
|
|
|
|
|
|
? |
CR175A |
*7 With 80A05, CR125A, or CR175A.
*8 With 80A05 Option 10G, CR125A, or CR175A.
*9 Draft version of the 8.5GFC filter. T11 committee redefined this filter at the April 2008 meeting. New 8.5GFC filter, as defined by T11 committee in April 2009, is identical to the 10GBase-R 10.313G filter and is available for 80C12 Option 10G modules and 80C14 modules; and is identified as 10Base-R.
*10 With CR125A or CR175A.
The 80E10, 80E08, and 80E04 are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing typical 12 ps incident and 15 ps reflected TDR step rise time. Each channel of these modules is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel’s step can be selected independently. This allows for true-differential or common-mode TDR or S-parameters testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true-differential measurements, which ensures measurement accuracy of nonlinear differential devices.
80E10 and 80E08 feature a small form factor, fully integrated independent 2-meter remote sampler system, enabling the location of the sampler and TDR step generator near the DUT for the best system fidelity. The modules characterize crosstalk by using TDR steps to drive one line (or line pair for differential crosstalk) while monitoring a second line (or line pair) with the other channel (or another module for differential crosstalk). The "rise time filter" function on the DSA8200 mainframe can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge speeds. An optional 2-meter extender cable for the 80E04 is available, which enables placement of the module near the DUT for the best system fidelity.
All modules have independent incident step and receiver deskew to remove the effect of fixtures and probes, enabling faster and easier deskew. The 80E10 Sampling module provides an acquisition rise time of 7 ps, with up to 50 GHz user-selectable equivalent bandwidth (with 50 GHz, 40 GHz, and 30 GHz settings). 80E08 sampling bandwidth is 30 GHz (user-selectable with 30 GHz and 20 GHz settings) and 80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended and the 18 GHz P80318 differential variable pitch TDR handheld probes provide excellent performance, ensuring easy and accurate backplane and package measurements.
TDR Module Summary
|
Module |
Typical TDR Rise Time at Full Bandwidth |
Bandwidth Performance*12 |
RMS Noise at Bandwidth*12 |
Remote Sampler |
|
|---|---|---|---|---|---|
|
Incident*11 |
Reflected*11 |
||||
|
80E10 |
12 ps |
15 ps |
50 GHz, 40 GHz, and 30 GHz(user selectable) |
50 GHz: 600 μV40 GHz: 370 μV 30 GHz: 300 μV |
Yes, fully integrated 2-meter cable |
|
80E08 |
18 ps |
20 ps |
30 GHz, 20 GHz (user selectable) |
30 GHz: 300 μV 20 GHz: 280 μV |
Yes, fully integrated 2-meter cable |
|
80E04 |
23 ps |
28 ps |
20 GHz |
600 μV |
No, optional 80N01 – 2-meter extender cable |
*11 Values shown are warranted unless printed in an italic typeface which represents a typical value.
*12 Calculated from .35 bandwidth rise time product.
The 80E09 and 80E07 are dual-channel modules with remote samplers, capable of noise as low as 450 μVRMS at 60 GHz bandwidth and 300 μVRMS noise at 30 GHz bandwidth. Each small form factor remote sampler is attached to a 2-meter cable to minimize the effects of cables, probes, and fixtures to ensure the best system fidelity. User-selectable bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal noise/bandwidth trade-off.
80E06 and 80E01 are single-channel 70+ and 50 GHz bandwidth sampling modules respectively. 80E06 provides the widest bandwidth and fastest rise time with world-class system fidelity. Both 80E06 and 80E01 provide a superior maximum operating range of ±1.6 V. Both modules can be used with the optional 2-meter extender cable, ensuring superior system fidelity and measurement flexibility.
The 80E03 is a dual-channel 20 GHz sampling module. This module provides an acquisition rise time of 17.5 ps or less. An optional 2-meter extender cable is available.
When used with Tektronix 80SJNB Jitter, Noise, and BER Analysis software, these modules enable separation of both jitter and noise into their constituent components, for insight into the underlying causes of eye closure and obtain highly accurate calculation of BER and 3-D eye contour. When used with the 82A04 Phase Reference module, time-base accuracy can be improved down to 200 fsRMS jitter which, together with the 300 μVRMS noise floor and 14 bits of resolution, ensures the highest signal fidelity for your measurements.
Electrical Module Summary
|
Electrical Module |
Step Response at Full Bandwidth (10-90%)*11 |
Number Of Channels |
Bandwidth*11, 13 |
RMS Noise at Bandwidth*11 |
Remote Sampler |
|---|---|---|---|---|---|
|
80E09 |
5.8 ps |
2 |
60/40/30 GHz (user selectable) |
60 GHz: 450 μV 40 GHz: 330 μV30 GHz: 300 μV |
Yes, fully integrated 2-meter cable |
|
80E07 |
11.7 ps |
2 |
30/20 GHz (user selectable) |
30 GHz: 300 μV20 GHz: 280 μV |
Yes, fully integrated 2-meter cable |
|
80E06 |
5.0 ps |
1 |
70+ GHz |
1.8 mV |
No, optional 80N01 – 2-meter extender cable |
|
80E03 |
17.5 ps |
2 |
20 GHz |
600 μV |
No, optional 80N01 – 2-meter extender cable |
|
80E01 |
7 ps |
1 |
50 GHz |
1.8 mV |
No, optional 80N01 – 2-meter extender cable |
*11 Values shown are warranted unless printed in an italic typeface which represents a typical value.
*13 Now obsolete module useful with older versions of the mainframe, but not needed with the 8200 Series mainframes.
The 82A04 Phase Reference module enhances the DSA8200 sampling oscilloscope from the industry's standard time-base jitter performance of 800 fsRMS, to the extremely low time-base jitter of <200 fsRMS. Typical application for the Phase Reference module is the acquisition and analysis of very high-speed optical and electrical signals in communication devices and systems. The 82A04 supports both the Triggered mode of operation, which is similar to usual acquisition, and the untriggered Free Run mode where all timing information comes from the customer-supplied clock alone (no trigger signal necessary). When the external clock is not available the module can accept the clock signal from the clock recovery output of the 80Cxx modules, as well as from the 80A05 module or CR125A, CR175A, or CR286A instruments. Additionally 82A04 supports SSC (Spread Spectrum Clocking) operation.
The 80A05 Electrical Clock Recovery module enables clock recovery for electrical signals, as well as internal triggering on the recovered clock. The module recovers clocks from serial data streams for all of the most common electrical standards in the 50 Mb/s to 4.25 Gb/s, around 5 to 6 Gb/s, and from 9.953 Gb/s to 12.5 Gb/s ranges. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors (at about 50% of the input level) and can be connected to sampling module(s) for differential or single-ended sampling. Option 10G is required for support of standard rates from 9.953 Gb/s to 12.6 Gb/s. Clock recovery for the 80C12 Optical Sampling module is provided through the 80A05 module or CR125A, CR175A, or CR286A instruments.
The 80A06 PatternSync Trigger module, when used in combination with 80SJNB software, enables characterizing jitter, noise, and BER performance of high-speed serial designs from 1 Gb/s to 60 Gb/s data rates. It extends the capability of the DSA8200 sampling oscilloscope by creating a pattern trigger from any data-related clock – a recovered clock, user-supplied clock, sub-clock, or super-clock. The PatternSync Trigger module is programmable to pattern lengths of up to 223 bits and accepts a user-supplied clock signal from 150 MHz to 12.5 GHz. The 80A06 module is required with the DSA8200 when using 80SJNB Advanced Jitter, Noise, and BER Analysis software package. This module can be used in combination with the 82A04 Phase Reference module for the best time-base accuracy or for acquisition of signals under SSC (Spread Spectrum Clocking).
CR125A, CR175A and CR286A Clock Recovery instruments recover clocks from serial data streams for all of the most common electrical standards in the continuous 150 Mb/s to 12.5 Gb/s, 150 Mb/s to 17.5 Gb/s, or 150 Mb/s to 28.6 Gb/s range respectively. Auto-locking capability is selectable from the user interface or programmatic interface, so the design and test engineers can search and lock onto signals of undefined or unknown data rate. The module accepts either single-ended or differential signals as its input, providing clock recovery for both. The signal(s) is/are then passed on to the output connectors and can be connected to sampling module(s) for differential or single-ended sampling. Tektronix clock recovery instruments offer complete configurability and state-of-the-art specifications and are the preferred solution for most serial data standards due to excellent stability, superior jitter and slew rate tolerance for recovering clocks from stressed or degraded signals, and unequaled PLL bandwidth and roll-off shape control for either Golden PLL compliance testing or custom PLL response. The clock recovery instruments also lock on spread-spectrum signals. The CR125A, CR175A, or CR286A can also serve as the Clock Recovery instrument for the 80C10B*14, 80C12, 80C14, or 80C25GBE. For more information on Tektronix Clock Recovery instruments see the BERTScope® CR Series data sheet at www.tektronix.com.
*14 Up to data rates of 28.6 Gb/s.
The P80318 is an 18 GHz 100 ? input impedance differential TDR hand probe. This probe enables high-fidelity impedance measurements of differential transmission lines. The adjustable probe pitch from 0.5 mm to 4.2 mm enables a wide variety of differential line spacing and impedances. The P80318 probe also includes two precision SMA cables with parallel control lines that provides the 80A02 module the control for EOS/ESD protection.
The P8018 Handheld TDR Probe is a 20 GHz, 50 ? ?input impedance, single-ended passive probe that provides a high-performance solution for electrical sampling, TDR circuit board impedance characterization, and high-speed electrical signal analysis applications. The P8018 probe also includes a precision SMA cable and parallel control line that provides the 80A02 module the control for EOS/ESD protection.
The 80A02 EOS/ESD Protection module protects the sampling bridge of Tektronix electrical sampling module inputs from damage by electrostatic charge. The 80A02 is intended for use in applications such as electrical TDR circuit board testing and cable testing where large static charges can be stored in the DUT.
When used with the matching P8018 20 GHz single-ended handheld probe or the P80318 differential handheld probe (both with probe tip pressure actuating feature) the 80A02 provides a superior technique and performance capability for electrical module EOS/ESD protection of acquired electrical signals and TDR measurements (two 80A02 modules required for differential applications).
The 80A03 provides probe power and control for up to two Tektronix P7000 Series probes. The 80A03 is powered through the oscilloscope and requires no user adjustments or external power cords. An Electrical Sampling module can be plugged directly into the slot on the 80A03 to provide the optimum system fidelity and a short electrical path. Using the 80A03, designers can benefit from industry-leading Tektronix active and differential probes to measure signals on SMD pins and other challenging circuit features.
This cable can be used to power and operate one 80A02 or 80A06 accessory module, eliminating the need to consume a small form factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger Power’ connector on the mainframe or (for 80A02) into the ‘Probe Power’ connector on most Electrical Sampling modules.
80SJNB speeds the identification of the underlying causes of both horizontal and vertical eye closure through separation of jitter and noise. With its unique insight into the constituent components of both jitter and noise, 80SJNB provides a highly accurate and complete BER calculation and eye contour analysis.
Additionally available in the software package is the first-ever set of features addressing the design issues of modern Serial Data Links: equalization with either FFE or DFE, channel emulation, support for fixture de-embedding, as well as full support for SSC – Spread Spectrum Clocking. When you combine jitter, noise, and BER analysis with the DSA8200 modular flexibility, uncompromised performance, and unmatched signal fidelity you get the ideal solution for next-generation high-speed serial data design validation and compliance testing. 80SJNB requires the 80A06 PatternSync module, which creates a trigger pulse on each complete pattern. 80SJNB may be used with the 82A04 Phase Reference module for enhanced accuracy or for SSC signals, or without it depending on your requirements. SSC max. amplitude 5000 ppm (6000 ppm) at 30 ±3 kHz. Version V2.1 and later of 80SJNB supports save and recall of the complete signal description. Also added is a new measurement DDPWS (Data Dependent Pulse Width Shrinkage) and a corresponding graph.
Jitter Analysis
|
Measurements |
Description |
|---|---|
|
TJ at BER |
Total jitter at specified BER |
|
J2 |
Total jitter for BER = 2.5e–3 |
|
J9 |
Total jitter for BER = 2.5e–10 |
|
RJ |
Random jitter |
|
RJ(h) |
Horizontal component of random jitter |
|
RJ(v) |
Vertical component of random jitter |
|
RJ(d-d) |
Random jitter according to the Dual Dirac model |
|
DJ |
Deterministic jitter |
|
DDJ |
Data-dependent jitter |
|
DDPWS |
Data-dependent Pulse Width Shrinkage |
|
DCD |
Duty cycle distortion |
|
DJ(d-d) |
Deterministic jitter computed in the Dual Dirac model |
|
PJ |
Periodic jitter |
|
PJ(h) |
Horizontal component of periodic jitter |
|
PJ(v) |
Vertical component of periodic jitter |
|
EO at BER |
Horizontal eye opening at specified BER |
80SJNB Noise Analysis
|
Measurements |
Description |
|---|---|
|
RN |
Random noise |
|
RN(v) |
Vertical component of random noise |
|
RN(h) |
Horizontal component of random noise |
|
DN |
Deterministic noise |
|
DDN1 |
Data-dependent noise on logical level 1 |
|
DDN0 |
Data-dependent noise on logical level 0 |
|
PN |
Periodic noise |
|
PN(v) |
Vertical component of periodic noise |
|
PN(h) |
Horizontal component of periodic noise |
|
EO at BER |
Vertical eye opening at specified BER |
|
SSC Magnitude |
Magnitude of SSC modulation in ppm |
|
SSC Frequency |
Frequency of SSC modulation in ppm |
80SJNB Advanced Supports:
The 80SJARB jitter measurement application software for the DSA8200 Series addresses IEEE 802.3ba applications requiring the J2 and J9 jitter measurements. It also enables basic jitter measurements for NRZ data signals including PRBS31, random traffic, and scrambled data. This provides an entry-level jitter analysis capability with simple Dual Dirac model jitter analysis and no hardware module requirements. 80SJARB can acquire continuously in “free run” mode, delivering acquisitions and updates beyond the IEEE minimum requirement of 10,000 data points. Plots include jitter bathtub curves for both measured and extrapolated data, as well as a histogram of the acquired data.
|
Measurement |
Description |
|---|---|
|
J2 |
Total jitter for BER = 2.5e–3 |
|
J9 |
Total jitter for BER = 2.5e–10 |
|
Tj |
Total jitter for BER = 1.0e–12 |
|
DJdd |
Deterministic jitter (Dual Dirac model) |
|
RJdd |
Random jitter (Dual Dirac model) |
Operating on the DSA8200 TDR platform, IConnect® S-parameters is the most cost-effective and highest throughput approach for S-parameter measurements in digital design, signal integrity analysis, and interconnect compliance testing, providing as much as 50% cost savings compared to similar bandwidth VNAs, and dramatically speeding up measurements. You can also take advantage of the IConnect® S-parameters command line interface, which automates the S-parameter measurements, to the overall suite of manufacturing tests you perform using your TDR instrument, significantly reducing test time while increasing measurement repeatability.
The simplicity of S-parameter calibration using a reference (open, short, or through), and an optional 50 ? load makes the measurement, fixture de-embedding, and moving the reference plane a snap. Touchstone file format output enables easy S-parameter file sharing for further data analysis and simulations.
Tektronix offers several true-differential TDR modules, which in combination with IConnect® offers S-parameter measurements to 50 GHz with up to 70 dB of dynamic range. This performance exceeds requirements for serial data analysis, digital design, and signal integrity applications, resolving down to 1% (–40 dB) accuracy of crosstalk, whereas electrical compliance testing masks typically call for the measurements in the –10 to –30 dB range.
IConnect® software allows you to quickly and easily generate SPICE and IBIS models for your PCBs, flex boards, connectors, cables, packages, sockets, and I/O buffer inputs directly from TDR/T or VNA S-parameter measurements. IConnect® allows you to display eye diagram degradation, jitter, loss, crosstalk, reflections, and ringing in your digital system. IConnect® Linear Simulator allows the designer to link several interconnect channels together to evaluate the total time, frequency domain performance, and eye diagram of the overall channel. IConnect® substantially simplifies the signal integrity analysis of the interconnect link, equalization and emphasis component design, and analysis of the interconnect link with transmitter and receiver.
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